Publications (PHM Membership Required)

 

Parameter Selection for Health Monitoring of Electronic Products, Sachin Kumar, Michael Pecht, Microelectronics Reliability, 30 October 2009.

Baseline Performance of Notebook Computers Under Various Environmental and Usage Conditions for Prognostics, Sachin Kumar, Michael Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 3, September 2009.

Model-based and Data-driven Prognosis of Automative and Electronic Systems, Chaitanya Sankavaram, Bharath Pattipati, Anuradha Kodali, Krishna Pattipati, Mohammad Azam, Sachin Kumar, and Michael Pecht, 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, August 22-25, 2009.

A Fusion Prognostics Method for Remaining Useful Life Prediction of Electronic Products, Shunfeng Cheng, and Michael Pecht, 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, August 22-25, 2009.

A Framework of Cost-effective and Accurate Maintenance Combining CBM RCM and Data Fusion, Gang Niu, Michael Pecht, Proceedings of ICRMS 2009, July 21-25, 2009.

Health Assessment and Prognostics of Electronic Products-An Alternative Method of product Life Cycle Cost Improvement, Jie Gu, Daniel lau, Michael Pecht, Proceeding of ICRMS 2009, July 21-25, 2009.

Physics-of-failure based Prognostics for Electronic Products, Michael Pecht and Jie Gu, Transactions of the Institute of Measurement and Control 31, 3/4 (2009), pp. 309-322.

Precursor Parameter Identification for Power Supply Prognostics and Health Management, Huiguo Zhang, Rui Kang, Michel Pecht, Proceedings of ICRMS 2009, july 20-24, 2009.

Detection of Solder Joint Failure Precursors on Tin-Lead and Lead-Free Assemblies using RF Impedance Analysis, Daeil Kwon, Michael H. Azarian, and Michael Pecht, Electronic Components and Technology Conference, 2009.

Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance, Daeil Kwon, Michael H. Azarian, and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 2, June 2009.

Prognostics-Based Product Qualification, Pecht, M. and Gu, J., IEEE Aerospace Conference, Big Sky, MT, March 7-14, 2009.

A Residual Estimation Based Approach for Isolating Faulty Parameters, Kumar, S., Dolev, E., Pompetzki, M., and Pecht, M., IEEE Aerospace Conference, Big Sky, MT, March 7-14, 2009

Detecting Failure Precursors in BGA Solder Joints, R. Jaai, M. Pecht, J. Cook, 55th annual Reliability and Maintainability Symposium (RAMS), Fort Worth, Texas, Jan 2009.

The Analysis of Return on Investment for PHM Applied to Electronic Systems, Kiri Feldman, Peter Sandborn, and Taoufik Jazouli, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008

Failure Precursors for Insulated Gate Bipolar Transistors, Nishad Patil, Diganta Das, Kai Goebel, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

IDDQ Trending as a Precursor to Semiconductor Failure , Guangfan Zhang, Diganta Das, Roger Xu, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Failure Mechanism Based Prognostics, Sony Mathew, Diganta Das, Roger Rosenberger, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Assessing the Operating Environment of IC Sockets in High-End Servers for Prognostics and Health Monitoring, Leoncio Lopez and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Early Detection of Interconnect Degradation Using RF Impedance and SPRT, Daeil Kwon, Michael H Azarian, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Failure Prognostics of Multilayer Ceramic Capacitor in Temperature-Humidity- Bias Conditions, Jie Gu, Michael Azarian, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Maxima-SPRT Methodology for Health Monitoring of Contact Resistance in IC Sockets, Leoncio Lopez and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Anomaly Detection in Electronic Products, Abraham Tomy Michael, Sachin Kumar, Sony Mathew and Michael Pecht, 2nd Electronics System-Integration Technology Conference, Greenwich, London, UK, September 1-4, 2008.

Sensor System Selection for Prognostics and Health Monitoring, S. Cheng, M. Azarian, and M. Pecht, 2008 ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference (IDETC/CIE 2008), Brooklyn, New York, USA, August 3-6, 2008.

Analyzing the Return on Investment Associated With Prognostics and Health Management of Electronic Products, Kiri Feldman and Peter Sandborn, 2008 ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference
(IDETC/CIE 2008), Brooklyn, New York, USA, August 3-6, 2008.

Failure Precursors for Insulated Gate Bipolar Transistors, N. Patil, D. Das, K. Goebel and M. Pecht, 9th International Seminar on Power Semiconductors, Prague, 27-29 August 2008.

Qualification for product development, Weiqiang Wang; Azarian, Michael H.; Pecht, Michael, International Conference on Electronic Packaging Technology and the International Symposium on High Density Packaging (ICEPT-HDP), 28-31 July 2008.

A Hybrid Prognostics Methodology for Electronics Systems, S. Kumar, M. Torres, M.Pecht, and Y. C. Chan - Special Session on Computational Intelligence for Anomaly Detection, Diagnosis, and Prognosis, IEEE World Congress on Computational Intelligence (WCCI 2008), June 1-6, 2008, Hong Kong.

Data Analysis Approach for System Reliability, Diagnostics and Prognostics,S. Kumar and M. Pecht - Pan Pacific Microelectronics Symposium, 22 - 24 Jan, 2008, Hawaii.

Effect of Solder Joint Degradation on RF Impedance, Kwon, D., Azarian, M., and Pecht, M., 12th IEEE Workshop on Signal Propagation on Interconnect, pp. 1-4 Avignon, France, 12-15 May 2008.

Detection of Solder Joint Degradation Using RF Impedance Analysis, Kwon, D., Azarian, M., and Pecht, M., IEEE Electronic Components and Technology Conference, pp. 606-610, Lake Buena Vista, FL, 27-30 May 2008.

Prognostics of Electronics under Vibration Using Acceleration Sensors, Jie Gu, Donald Barker, and Michael Pecht, Proceeding for 62nd Meeting of the Society for Machinery Failure Prevention Technology (MFPT), pp. 253-263, Virginia Beach, VA, May 2008.

Autonomous Prognostic Monitoring Device, S.Cheng, M. Torres, L. Thomas, and M. Pecht, Proceedings of the 62th Meeting of the Society for Machinery Failure Prevention Technology, pp.505-516 , Virginia Beach, VA, May 2008.

Mahalanobis Distance and Projection Pursuit Analysis for Health Assessment of Electronic Systems, S. Kumar, V. Sotiris, and M. Pecht, IEEE Aerospace Conferece, Big Sky, Montana, March 2008.

Prognostics and Health Management Using Physics of Failure, J. Gu and M. Pecht, 54th annual Reliability and Maintainability Symposium (RAMS), Las Vegas, Nevada, Jan. 2008

Prognostics Implementation of Electronics under Vibration Loading, J. Gu, D. Barker and M. Pecht, Microelectronics Reliability, Vol. 47, Issue 12, pp. 1849-1856, Dec. 2007.

Multivariate State Estimation Technique for Remaining Useful Life Prediction of Electronic Products, S. Cheng and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 26-32, Arlington, VA, Nov, 2007.

Health Monitoring of Electronic Products Using Symbolic Time Series Analysis, S. Kumar and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 73-80, Arlington, VA, Nov, 2007.

Support Vector Prognostics Analysis of Electronic Products and Systems, V. Sotiris and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 120-127, Arlington, VA, Nov, 2007.

Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration, J. Gu, D. Barker, and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp.50-57, Nov. 2007.

Embedded Remaining Life Prognostics and Diagnostics of Electronics, V. Rouet, A. Delye, N. Vichare, M. Pecht, and B. Foucher, MicroNanoReliability Congress, Berlin, Germany, September 2-5, 2007

Technology Assessment of Sensor Systems for Prognostics and Health Monitoring, B. Tuchband, S. Cheng, and M. Pecht, IMAPS on Military, Aerospace, Space and Homeland Security: Packaging Issues and Applications (MASH), May, 2007.

Virtual Remaining Life Assessment of Electronic Hardware Subjected to Shock and Random Vibration Life Cycle Loads, S. Mathew, D. Das, M. Osterman, M. Pecht, R. Ferebee, and J. Clayton,  Journal of the IEST, Vol. 50, No. 1, pp. 86- 97, April 2007 .

Prognostics of Ceramic Capacitor Temperature-Humidity-Bias Reliability Using Mahalanobis Distance Analysis, L. Nie, M. Azarian, M. Keimasi, and M. Pecht, Circuit World, Vol. 33, No.3, pp. 21-28, 2007.

The Use of Prognostics in Military Electronic Systems, B. Tuchband and M. Pecht, Proceedings of the 32nd GOMACTech Conference, pp. 157-160, Lake Buena Vista, FL, March 19-22, 2007.

Energetic Material/Systems Prognostics, D. Han, M. Pecht, D. Anand, and R. Kavetsky, 53rd Annual Reliability & Maintainability Symposium (RAMS), Florida, 2007.

Prognostics Implementation Methods for Electronics, J. Gu, N. Vichare, T. Tracy, and M. Pecht, 53rd Annual Reliability & Maintainability Symposium (RAMS), Florida, 2007.

An Enhanced Prognostic Model for Intermittent Failures in Digital Electronics, G. Zhang, C. Kwan, R. Xu, N. Vichare, and M. Pecht, IEEE Aerospace Conference, Big Sky, MT, March 2007.

Environment and Usage Monitoring of Electronic Products for Health Assessment and Product Design, N. Vichare, P. Rodger, V. Eveloy, and M. Pecht, International Journal of Quality Technology and Quantitative Management, 2007.

Prognostic Assessment of Aluminum Support Structure on a Printed Circuit Board, S. Mathew, D. Das, M. Osterman, M. Pecht, and R. Ferebee ASME Journal of Electronic Packaging, Vol. 128, Issue 4, pp. 339-345, December 2006.

A Methodology for Assessing the Remaining Life of Electronic Products, S. Mathew, P. Rodgers, V. Eveloy, N. Vichare, and M. Pecht, International Journal of Performability Engineering, Vol. 2, No. 4, pp. 383-395, October, 2006.

Enabling Electronic Prognostics Using Thermal Data, N. Vichare and M. Pecht, Proceedings of the 12th International Workshop on Thermal Investigation of ICs and Systems, Nice, Côte d'Azur, France, 27-29 September 2006.

Methods for Binning and Density Estimation of Load Parameters for Prognostics and Health Management, Vichare N., Rodgers P., and Pecht, M., International Journal of Performability Engineering, Vol. 2, No. 2, April 2006.

Prognostics and Health Management of Electronics, N. Vichare and M. Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 1, March 2006.

A Decision Support Model for Determining the Applicability of Prognostic Health Management (PHM) Approaches to Electronic Systems, P. Sandborn, Proc. Reliability and Maintainability Symposium, pp. 422-427, January 24-27, 2005.

In Situ Temperature Measurement of a Notebook Computer - A Case Study in Health and Usage Monitoring of Electronics, N. Vichare, P. Rodgers, V. Eveloy, and M. Pecht IEEE Transactions on Device and Materials Reliability, Vol. 4., No. 4, pp. 658-663, December 2004.

Prognostics and Health Management for Improved Dispatchability of Integrated Modular Avionics Equipped Aircraft, C. Wilkinson,23rd Digital Avionics Systems Conference (DASC), Salt Lake City, UT, October 2004.

Application of Health Monitoring to Product Take-back Decisions, N. Vichare, P. Rodgers, M. Azarian, and M. Pecht, Proceedings of the Joint International Congress and Exhibition - Electronics Goes Green 2004, pp. 945-951, Berlin, Germany, September 6-8 2004.

Prognostics and Health Management for Avionics, Wilkinson, C., Humphrey, D., Vermeire, B., and Houston, J., IEEE Aerospace Conference, Big Sky, MT, Mar. 2004.

Life Consumption Monitoring for Electronics Prognostics, S. Mishra, S. Ganesan, M. Pecht and J. Xie, Proceedings of the IEEE Aerospace Conference, Vol. 5, pp. 3455 - 3467. March 6-13, 2004.

Application of In-Situ Health Monitoring and Prognostic Sensors, J. Xie and M. Pecht 9th Pan Pacific Microelectronics Symposium Exhibits and Conference, Kahuku, Oahu, Hawaii, 10-12 February 2004.

Load Characterization during Transportation, A. Ramakrishnan and M. Pecht, Microelectronics Reliability, Vol. 44, No. 2, pp. 333-338, January 2004.

Methods for Predicting the Remaining Life of Electronic Assemblies with Carbon Nanotubes and an Optical Transduction Technique, P. Casey, S. Ganesan, M. Pecht and D. Anand, Proceeding of IMECE' 03 - 2003 ASME International Mechanical Engineering Congress, Washington, D.C. November 15-21, 2003.

A Life Consumption Monitoring Methodology for Electronic Systems, Ramakrishnan, A. and Pecht, M., IEEE Transactions on Components and Packaging Technologies, Vol. 26, No. 3, pp. 625-634, September 2003.

Remaining Life Assessment of Aging Electronics in Avionic Applications, R. Valentin, M. Osterman, B. Newman, The Annual Reliability and Maintainability Proceedings, , pp. 313-318, Tampa, Florida, January 27-30, 2003.

Virtual Life Assessment of Electronic Hardware Used in the Advanced Amphibious Assault Vehicle (AAAV), R. Valentin, J. Cunningham, M. Osterman, A. Dasgupta, M. Pecht and D. Tsagos, Proceedings of the 2002 Winter Simulation Conference, Vol. 1, pp. 948-953, San Diego, California, December 8-11, 2002.

Aging Aircraft Usable Life and Wear-out Issues, D. Humphrey, W. Shawlee, P. Sandborn, D. Lorenson, , Proc. World Aviation Congress (SAE Technical Paper: 2002-1-3013), Phoenix, AZ, November 2002.

Remaining Life Assessment of Shuttle Remote Manipulator System End Effector Electronics Unit, V. Shetty, D. Das, M. Pecht, D. Hiemstra and S. Martin, Proceedings of the 22nd Space Simulation Conference, Ellicott City, MD, October 21-23, 2002.

Remaining Life Prediction of Electronic Products Using Life Consumption Monitoring Approach, S. Mishra, M. Pecht, T. Smith, I. McNee, and R. Harris, Proceedings of the European Microelectronics Packaging and Interconnection Symposium, pp. 136-142, Cracow, June 16-18, 2002.

In-situ Sensors for Product Reliability Monitoring, Mishra, S. and Pecht, M., Proceedings of SPIE, Vol. 4755, pp. 10-19, 2002.

Evaluation of Built-In Test, M. Pecht, M. Dube, M. Natishan, and I. Knowles, IEEE Transactions on Aerospace and Electronic Systems, Vol. 37, No. 1, pp. 266-272, January 2001.

"Smart" Electronic Systems for Condition-Based Health Management, N. Kelkar, A. Dasgupta, M. Pecht, I. Knowles, M. Hawley, and D. Jennings, Quality and Reliability Engineering International, Vol. 13, pp. 3-7, 1997.

Characterizing the Commercial Avionics Thermal Environment for Field Reliability Assessment, K. Cluff, D. Barker, D. Robbins, and T. Edwards, Proceedings-Institute of Environmental Sciences, pp. 50-57, 1996.