Publications (PHM Membership Required)

In Press| 2016 | 2014 | 2013| 2012 | 2011 |2010 | 2009 | 2008| 2007 | 2006 | 2005 | 2004 | 2003 | 2002 | 2001 | 2000 and prior

In Press

The effect of temperature on the electrochemistry in Lithium-ion batteries, Feng Lenga, Cher Ming Tana, Michael Pecht and JiYe Zhanga,3rd Int'l Symp. On Next-Generation Electronics,Taoyuan, Taiwan, May 7-10, 2014.

Motor Bearing Fault Diagnosis Using Trace Ratio Linear Discriminant Analysis, Xiaohang Jin, Mingbo Zhao, Tommy W. S. Chow and Michael Pecht,to be published, IEEE Transactions On Industrial Electronics, Vol. 61, No. 5, May 2014.

Diagnostics and Prognostics Method for Analog Electronic Circuits, Arvind Sai Sarathi Vasan, Bing Long and Michael Pecht, Accepted, IEEE Transactions on Industrial Electronics, Vol. 60, November 2013.

Prognostics of lithium-ion batteries based on relevance vectors and a conditional three-parameter capacity degradation model, Dong Wang, Qiang Miao, and Michael Pecht, Journal of Power Sources, Volume 239, Pages 253–264, October 2013, pp 772-780

2016

A Hybrid Feature Selection Scheme for Reducing Diagnostic Performance Deterioration Caused by Outliers in Data-Driven Diagnostics, Myeongsu Kang, Md. Rashedul Islam, Jaeyoung Kim, Jong-Myon Kim, and Michael Pecht IEEE Transactions on Industrial Electronics, Vol. 63, NO. 5, May 2016.

2014

Prognostics of Chromaticity State for Phosphor-Converted White Light Emitting Diodes Using an Unscented Kalman Filter Approach , Jiajie Fan, Kam-Chuen Yung and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 14, No. 1, pp. 564-573, March 2014.

Prognostics of Lumen Maintenance for High Power White Light Emitting Diodes Using a Nonlinear Filter-based Approach , Jiajie Fan, Kam-Chuen Yung and Michael Pecht, Reliability Engineering & System Safety, Vol. 123, pp. 63-72, March 2014.

Introduction to LED Thermal Management and Reliability, Michael Pecht, Diganta Das, Moon-Hwan Chang, Thermal Management for LED Applications, Solid State Lighting Technology and Application Series, Vol. 2, pp. 3-14, 2014, doi:0.1007/978-1-4614-5091-7_1.

Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based-Metric Test , Moon-Hwan Chang, Chaochao Chen, Diganta Das and Michael Pecht, IEEE Transactions on Industrial Informatics, Vol.10, No.3, pp 1852-1863, August 2014, doi: 10.1109/TII.2014.2332116.

2013

Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance, Yu Wang, Qiang Miao, Eden W.M.Ma, Kwok-Leung Tsui and Michael G. Pecht, IEEE Transactions on Reliability, Vol. 62, No. 1, pp. 136-145, March 2013, doi: 10.1109/TR.2013.2241204.

Comparative Analysis of Features for Determining State of Health in Lithium-Ion Batteries, Nick Williard, Wei He, Michael Osterman, and Michael Pecht,International Journal of the PHM Society Special Issue: Battery Management, 4(1), pp. 1.7, 2013.

Degradation Data Analysis Using Wiener Processes With Measurement Errors, Zhi-Sheng Ye, Member, IEEE, YuWang, Student Member, IEEE, Kwok-Leung Tsui, and Michael Pecht, Fellow, IEEE, IEEE TRANSACTIONS ON RELIABILITY, VOL. 62, NO. 4, DECEMBER 2013

Quantitative Analysis of Lithium-Ion Battery Capacity Prediction via Adaptive Bathtub-Shaped Function, Yi Chen, Qiang Miao, Bin Zheng, ShaominWu, and Michael Pecht, Energies, 6, pp. 3082-3096, June 2013.

Prognostics for state of health estimation of lithium-ion batteries based on combination Gaussian process functional regression, Datong Liu, Jingyue Pang, Jianbao Zhou, Yu Peng, and Michael Pecht, Microelectronics Reliability, Volume 53, Issue 6, Pages 832-839, June 2013.

Remaining useful life prediction of lithium-ion battery with unscented particle filter technique, Qiang Miao, Lei Xie, Hengjuan Cui, Wei Liang, and Michael Pecht, Microelectronics Reliability, Volume 53, Issue 6, Pages 805-810, June 2013.

State of charge estimation for electric vehicle batteries using unscented kalman filtering, Wei He, Nicholas Williard, Chaochao Chen, and Michael Pecht, Microelectronics Reliability, Volume 53, Issue 6, Pages 840-847, June 2013.

An ensemble model for predicting the remaining useful performance of lithium-ion batteries, Yinjiao Xing, Eden W.M. Ma, Kwok-Leung Tsui, and Michael Pecht, Microelectronics Reliability, Volume 53, Issue 6, Pages 811-820, June 2013.

Optimized Diagnostic Model Combination for Improving Diagnostic Accuracy, S. Kunche, C. Chen. and M. Pecht, 2013 IEEE Aerospace Conference, Big Sky, Montana, March 2-9, 2013.

A Bayesian Hidden Markov Model-Based Approach for Anomaly Detection in Electronic Systems, E. Dorj, C. Chen. and M. Pecht, 2013 IEEE Aerospace Conference, Big Sky, Montana, March 2-9, 2013.

Point-of-Care Biosensor Systems, Arvind Sai Sarathi Vasan, Ravi Doraiswami, Dinesh Michael Mahadeo, Yunhan Huang and Michael Pecht, Frontiers in Bioscience, Scholar, 5, 39-71, January 1, 2013.

2012

Life Prediction of LED-Based Recess Downlight Cooled by Synthetic Jet, Liyu Zheng, Janis Terpenny, Peter Sandborn, Raymond Nelson III, Microelectronics Reliability, Vol. 52, Issue 5, Pages 937-948, doi: 10.1016/j.microrel.2011.04.014, May 2012

Lifetime Estimation of High-Power White LED using Degradation-Data-Driven Method, Jiajie Fan, Kam-Chuen Yung, and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 12, No. 2, pp. 470-477, June 2012.

Light Emitting Diodes Reliability Review, M.H. Chang, D. Das, P. Varde, M. Pecht, Microelectronics Reliability, Vol. 52, Issue 5, Pages 762-782, May 2012.

Optimum Design Domain of LED-based Solid State Lighting Considering Cost, Energy Consumption and Reliability, Bong-Min Song, Bongtae Han and Joon-Hyun Lee, Microelectronics Reliability, DOI: 10.1016/j.microrel.2012.10.010, October 2012.

A novel electrostatic Radio Frequency Micro Electromechanical Systems (RF MEMS) with Prognostics function, Yunhan Huang, Michael Osterman and Michael Pecht, IEEE Electronic Components and Technology Conference (ECTC), Vol., No., pp. 121-126, May 29,2012 - June 1,2012, doi:10.1109/ECTC.2012.6248816

A Canary Device based Approach for Prognosis of Ball Grid Array Packages, S. Mathew, M. Osterman. and M. Pecht, 2012 IEEE Conference on Prognostics and Health Management (PHM), Denver, CO, June 18 - 22, 2012.

Prognostics of Multilayer Ceramic Capacitors Via the Parameter Residuals, Jianzhong Sun, Shunfeng Cheng, and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 12, No. 1, March 2012.

Prognostics Method for Analog Electronic Circuits, Arvind Sai Sarathi Vasan, Bing Long and Michael Pecht, Annual Conference of Prognostics and Health Management Society, 2012.

Estimation of Remaining Useful Life of Ball Bearings using Data Driven Methodologies, Edwin Sutrisno, Hyunseok Oh, Arvind Sai Sarathi Vasan and Michael Pecht, IEEE Conference on Prognostics and Health Management, 2012.

Diagnosis of Rolling Element Bearing Fault in Bearing-Gearbox Union System using Wavelet Packet Correlation Analysis,Changning Li, Jing Tian, and Michael Pecht, MFPT 2012 proceedings: The Prognostics and Health Management Solutions Conference, Dayton, OH, April, 24-26, 2012.

A Review of PHM System’s Architectural Frameworks,Surya Kunche, Chaochao Chen, and Michael Pecht, MFPT 2012 proceedings: The Prognostics and Health Management Solutions Conference, Dayton, OH, April, 24-26, 2012.

Model based Battery Management System for Condition based Maintenance, Nick Williard, Wei He, and Michael Pecht, MFPT 2012 proceedings: The Prognostics and Health Management Solutions Conference, Dayton, OH, April, 24-26, 2012.

Anomaly Detection of Polymer Resettable Circuit Protection Devices, Shunfeng Cheng, Kwok Tom, and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 12, No. 2, June 2012.

Comparison of Statistical Models for the Lumen Lifetime Distribution of High Power White LEDs, Jiajie Fan, K.C.Yung & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

Review of Offshore Wind Turbine Failures and Fault Prognostic Methods, Bill Chun Piu Lau, Eden Wai Man Ma & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

Use of Temperature as a Health Monitoring Tool for Solder Interconnect Degradation in Electronics, Preeti Chauhan, Michael Osterman, Qiang Yu & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

Prognostics of Lithium-Ion Batteries Using Model-Based and Data-Driven Methods, Chaochao Chen & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

Application of Unscented Particle Filter in Remaining Useful Life Prediction of Lithium-ion Batteries, Heng-Juan Cui, Qiang Miao, Wei Liang, Zhonglai Wang & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

State of Charge Estimation for Electric Vehicle Batteries under an Adaptive Filtering Framework, Wei He, Nicholas Williard, Chaochao Chen & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

A Case Study on Battery Life Prediction Using Particle Filtering, Yinjiao Xing, Eden W. M. Ma, K.L. Tsui & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

Evaluating Nominal Parameters in Fault Diagnosis, Eden W. M. Ma, Tommy W. S. Chow & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

Fan Bearing Fault Diagnosis Based on Continuous Wavelet Transform and Autocorrelation, Lei Xie, Qiang Miao, Yi Chen, Wei Liang & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

An Investigation into Fan Reliability, Xiaohang Jin, Eden W. M. Ma, Tommy W. S. Chow & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

A Prognostics and Health Management Strategy for Complex Electronic Systems, Bing Long, Houjun Wang, Qiang Miao & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

A Fusion Approach for Anomaly Detection in Hard Disk Drives, Yu Wang, Eden W. M. Ma, KL Tsui & Michael Pecht, 2012 Prognostics & System Health Management Conference (PHM-2012 Beijing), 2012.

Using Cross-Validation for Model Parameter Selection of Sequential Probability Ratio Test, Shunfeng Cheng and Michael Pecht, Expert Systems with Applications 39 (2012) 8467–8473, 2012.

A Prognostic Approach for Non-punch Through and Field Stop IGBTs, Nishad Patil, Diganta Das, and Michael Pecht, Microelectronics Reliability 52 (2012) 482–488, 2012.

Identification of Failure Mechanisms to Enhance Prognostic Outcomes, Sony Mathew, Mohammed Alam, and Michael Pecht, ASM Journal of Failure Analysis and Prevention, Journal of Failure Analysis and Prevention: Volume 12, Issue 1, Page 66-73, 2012.

Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process, Xiao-Sheng Si, Wenbin Wang, Chang-Hua Hu, Dong-Hua Zhou, and Michael G. Pecht, IEEE Transactions on Reliability, Vol. 61, No. 1, March 2012.

2011

Return on Investment of a LED Lighting System, Yuchen Li, Michael Pecht, Shunong Zhang and Rui Kang, Prognostics and System Health Management Conference 2011, Shenzhen, China, pp. 1-5, May 24-25, 2011, doi:10.1109/PHM.2011.5939555.

Physics-of-Failure-Based Prognostics and Health Management for High-Power White Light-Emitting Diode Lighting, J. Fan, K. C. Yung, and M. Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 11, No. 3, pp. 407-416, September 2011.

Prognostics and health monitoring for lithium-ion battery, Yinjiao Xing, Qiang Miao, K.-L. Tsui and Michael Pecht, IEEE International Conference on Intelligence and Security Informatics (ISI), 2011, Vol., No., pp.242-247, July 10-12, 2011, doi:10.1109/ISI.2011.5984090.

Economic Analysis of Canary-Based Prognostics and Health Management, Wenbin Wang and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 58, No. 7, pp. 3077 - 3089, July 2011, doi:10.1109/TIE.2010.2072897.

Failure Modes, Mechanisms, and Effects Analysis for LED Backlight Systems used in LCD TV's, J. Fan, K.C. Yung and M. Pecht, Prognostics and System Health Management Conference 2011, pp.1-5, Shenzhen, China, May 24-25, 2011

Prognostics of Systems: Approaches and Applications, S. Mathew and M. Pecht, Proceedings of the 24th International Congress on Condition Monitoring and Diagnostic Engineering Management (COMADEM 2011), Norway, May 31- June 2, 2011.

Battery Management Systems in Electric and Hybrid Vehicles, Yinjiao Xing, Eden W. M. Ma, Kwok L. Tsui and Michael Pecht, Energies 2011, 4, 1840-1857, 2011.

A Health Indicator Method for Degradation Detection of Electronic Products, Sachin Kumar, Nikhil M. Vichare, Eli Dolev and Michael Pecht, Microelectronics Reliability, 52 (2012) 439–445, 2011.

Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches, M. Alam. M. Azarian, M. Osterman and M. Pecht, Journal of Intelligent Material Systems and Structures, Volume 22 Issue 12, August 2011

Method for Valuating Options Arising in PHM , Gilbert Haddad, Peter Sandborn, and Michael Pecht, IEEE International Conference on Prognostics and Health Management, Denver, CO, June 21, 2011.

CLCC Solder Joint Life Prediction under Complex Temperature Cycling Loading , Fei Chai, Michael Osterman, and Michael Pecht, IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17-19, 2011.

Prognostics of Lithium-ion Batteries using Extended Kalman Filtering , Wei He, Nick Williard, Michael Osterman, and Michael Pecht, IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17-19, 2011.

Predicting Remaining Capacity of Batteries for UAVs and Electric Vehicle Applications , Nick Williard, Wei He, Michael Osterman, Michael Pecht, IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17-19, 2011.

Software Reliability Analysis of Laptop Computers, W. Wang, Michael Pecht, Proceedings of 7th IMA Conference for Modelling Industrial Maintenance and Reliability, Cambridge, UK., April 18-20, 2011.

Experimental Validation of LS-SVM Based Fault Identification in Analog Circuits Using Frequency Features, A. Vasan, B. Long, and M. Pecht, World Congress on Engineering Asset Management, 2011, 6th Annual Conference, Cincinnati, Ohio, Oct. 2011.

Investigation of Stochastic Differential Models and a Recursive Nonlinear Filtering Approach for Fusion-Prognostics, A. Vasan and M. Pecht, Annual Conference of the Prognostics and Health Management Society, Montreal, Quebec, Sept. 2011.

Research on Features for Diagnostics of Filtered Analog Circuits Based on LS-SVM, B. Long, S. Tian, Q. Miao, and M. Pecht, Autotestcon 2011, Baltimore, MD, Sep.12-15, 2011.

Automatic data mining for telemetry database of computer systems, C. Wu, C Yang, S. Lo, N. Vichare, E. Rhem, M. Pecht Microelectronics Reliability, Volume 51, Issue 2,Pages 263-269, February 2011.

Determining a Dynamic Maintenance Threshold using Maintenance Options, Gilbert Haddad, Peter Sandborn, and Michael Pecht, World Congress on Engineering Asset Management, Cincinnati, OH, Oct. 2011

Guaranteeing High Availability of Wind Turbines , G. Haddad, P.A. Sandborn, T. Jazouli, M.G. Pecht, B. Foucher, V. Rouet 2011 ESREL Conference, Troyes, France, September 18-22, 2011.

Using Real Options to Manage Condition-Based Maintenance Enabled by PHM , Gilbert Haddad, Peter Sandborn, and Michael Pecht 2011 IEEE International Conference on Prognostics and Health Management, Denver, Colorado, June 20-23, 2011 .

A Real Options Optimization Model To Meet Availability Requirements For Offshore Wind Turbines, Gilbert Haddad, Peter Sandborn, and Michael Pecht.MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, 10-12 May 2011.

Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics, Gang Niu, Satnam Singh, Steven W. Holland, Michael Pecht Microelectronics Reliability, Volume 51, Issue 2, Pages 279-284, February 2011.

Estimation Of Fan Bearing Degradation Using Acoustic Emission Analysis And Mahalonabis Distance, Hyunseok Oh, Michael H. Azarian, and Michael Pecht.MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, 10-12 May 2011.

Risks To Telecommunication Equipment Under Free Air Cooling Conditions And Their Mitigation, Jun Dai, Diganta Das, and Michael Pecht.MFPT: The Applied Systems Health Management Conference 2011, 10-12 May 2011 Virginia Beach, Virginia.

Prognostics-based Health Management for Telecom Equipment under Free Air Cooling, J. Dai, D. Das, and M. Pecht, EUROCON 2011, Lisbon, Portugal, April 27-29, 2011

Junction Temperature Characterization of High Power Light Emitting Diodes, M. Chang, D. Das, and M. Pecht, IMAPS Mid-Atlantic Microelectronics Conference 2011, June 23-24, 2011, Atlantic City, New Jersey.

Early Detection of Avalanche Breakdown in Embedded Capacitors Using SPRT, Mohammed A. Alam, Michael H. Azarian, Michael Osterman and Michael Pecht.MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, 10-12 May 2011.

Applications of Health Monitoring to Wind Turbines,Michael H. Azarian, Ranjith S.R. Kumar, Nishad PatilL,Anshul Shrivastava, and Michael Pecht.24th Internationl Conference on Condition Monitoring and Diagnostics Engineering Management,30th May to 1st June 2011, Stavanger,Norway.

PHM Enabled Logistics (Return on Investment and Availability Management),Peter Sandborn,2011 PHM Conference, Shenzhen, May 24, 2011.

Non-Destructive Sensing of Interconnect Failure Mechanisms Using Time Domain Reflectometry, D. Kwon, M. H. Azarian, and M. Pecht, , IEEE Sensors Journal, vol.11, no.5, pp.1236,1241, May 2011.

Complex system maintainability verification with limited samples, Microelectronics Reliability, Qiang Miao, Liu Liu, Yuan Feng, Michael Pecht Microelectronics Reliability, Volume 51, Issue 2, Pages 294-299, February 2011.

Identification of multiple characteristic components with high accuracy and resolution using the zoom interpolated discrete Fourier transform, Qiang Miao, Lin Cong and Michael Pecht Measurement Science And Technology, Volume 22 055701 doi: 10.1088/0957-0233/22/5/055701

Rolling Element Bearing Fault Feature Extraction Using EMD-Based Independent Component Analysis, Qiang Miao*, Dong Wang, and Michael Pecht.IEEE: International Prognostics and Health Management Conference, 21st to 23rd June 2011, Denver CO.

Cooling Fan Bearing Fault Identification Using Vibration Measurement, Qiang Miao, Michael H. Azarian, and Michael Pecht.IEEE: International Prognostics and Health Management Conference, 21st to 23rd June 2011, Denver CO.

Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations, S. Cheng, D. Das, and M. Pecht, ICBO: International Conference on Biomedical Ontology, Buffalo, NY, July 26-30, 2011, pp. 340-345.

Prognostics for Polymer Positive Temperature Coefficient Resettable Fuses, Shunfeng Cheng, Kwok Tom, and Michael Pecht.MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, 10-12 May 2011.

Identification Of Failure Mechanisms To Enhance Prognostic Outcomes, Sony Mathew, Mohammed Alam, Michael Pecht.MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, 10-12 May 2011.

Prognostics of Systems: Approaches and Applications, Sony Mathew and Michael Pecht. 24th Internationl Conference on Condition Monitoring and Diagnostics Engineering Management,30th May to 1st June 2011, Stavanger,Norway.

Identification Of Failure Mechanisms To Enhance Prognostic Outcomes, Sony Mathew, Mohammed Alam, and Michael Pecht.MFPT: The Applied Systems Health Management Conference 2011, 1Virginia Beach, Virginia, 10-12 May 2011.

Using PHM to Meet Availability-Based Contracting Requirements,Taoufik Jazouli and Peter Sandborn.IEEE: International Prognostics and Health Management Conference, 21st to 23rd June 2011, Denver CO.

Prognostics of lithium-ion batteries based on Dempster–Shafer theory and the Bayesian Monte Carlo method,Taoufik Jazouli and Peter Sandborn.IEEE: International Prognostics and Health Management Conference, 21st to 23rd June 2011, Denver CO.

Remaining Useful Performance Analysis of Batteries, Wei He, Nicholas Williard, Michael Osterman, Michael Pecht,Journal of Power Sources 2011

Prognostics and Health Management's Potential Benefits to Warranty,Y. Ning, P. Rundle and M. Pecht, The Seventh Annual Warranty Chain Management Conference, San Diego, CA, March 15-17, 2011.

Guaranteeing High Availability of Alternative Energy Systems, G. Haddad, P. Sandborn, T. Jazouli, M. Pecht, B. Foucher, and V. Rouet, European Safety and Reliability Association, France, September 2011.
In Advances in Safety, Reliability and Risk Management, 2012 Taylor & Francis Group, London,
ISBN 978-0-415-68379-1

Using Real Options to Manage Flexibility Enabled by PHM, G. Haddad, P. Sandborn, and M. Pecht, 2011 IEEE International Conference on Prognostics and Health Management, Denver, CO, May 2011.

2010

Hierarchical Life Prediction Model for Actively Cooled LED-Based Luminaire, Bong-Min Song, Bongtae Han, Avram Bar-Cohen, Rajdeep Sharma, and Mehmet Arik, IEEE Transactions on Components and Packaging Technologies, Vol. 33, No. 4, Pages 728-737, December 2010.

Modeling Approaches for Prognostics and Health Management of Electronics, S. Kumar and M. Pecht, International Journal of Performability Engineering, Vol. 6, No. 5, pp. 467-476, September 2010.

Approach to Fault Identification for Electronic Products Using Mahalanobis Distance, S. Kumar, T.W.S. Chow, and M. Pecht, IEEE Transactions on Instrumentation and Measurement, Vol. 59, No. 8, pp. 2055-2064, August 2010

A Design for Availability Approach for Use with PHM, T. Jazouli and P. Sandborn, Proceedings of the International Conference on Prognostics and Health Management, Portland, OR, October 2010

Degradation of Digital Signal Characteristics Due to Intermediate Stages of Interconnect Failure, D. Kwon, M. H. Azarian, and M. G. Pecht, , Sensors, Fourteenth IEEE Workshop on Signal Propagation on Interconnects, Hildesheim, Germany, May 9-12, 2010.

Physics-of-Failure Approach for Fan PHM in Electronics Applications, H. Oh, M. H. Azarian, M. Pecht, C. H. White, R. C. Sohaney, and E. Rhem, , Proceedings of the IEEE Prognostics and System Health Management Conference 2010, Macau, China, January 12-14, 2010.

Prognostics of Interconnect Degradation using RF Impedance Monitoring and Sequential Probability Ratio Test, D. Kwon, M. H. Azarian, and M. Pecht, , International Journal of Performability Engineering, vol. 6, no. 4 , pp. 351-360, 2010.

Early Detection Of Avalanche Breakdown In Embedded Capacitors Using SPRT , Mohammed A. Alam , Michael Osterman, Michael H. Azarian, Michael Pecht, 2010.

Prognostics Of Embedded Planar Capacitors Under Temperature And Voltage Aging , Mohammed A. Alam , Michael Osterman, Michael H. Azarian, Michael Pecht Proceedings of the ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, SMASIS2010, September 28 – October 1, 2010, Philadelphia, Pennsylvania, USA, 2010.

Failure Precursors for Polymer Resettable Fuses, Shunfeng Cheng, Michael G. Pecht and Kwok Tom IEEE, Transactions on Device and Materials Reliability, Vol. 10, No. 3, September 2010

Sensor Systems for Prognostics and Health Management, Shunfeng Cheng, Michael H. Azarian and Michael G. Pecht, Sensors, Vol. 10, Issue 6, pp. 5774-5797,June 2010.

A multi-component and multi-failure mode inspection model based on the delay time concept, Wenbin Wanga, Dragan Banjevic, Michael Pecht, Reliability Engineering and System Safety, 2010.

A Wireless Sensor System for Prognostics and Health Management, Shunfeng Cheng, KwokTom, Larry Thomas, and Michael Pecht, IEEE Sensors Journal, Vol. 10, NO. 4, April 2010.

Anomaly Detection Through a Bayesian Support Vector Machine, Vasilis A. Sotiris, Peter Tse and Michael Pecht, Journal of Transaction on Reliability, Vol. 1, No. 1, June 2010.

A prognostics and health management roadmap for information and electronics-rich systems, Rubyca Jaai and Michael Pecht, Microelectronics Reliability, Volume 50, Issue 3, March 2010, Pages 317-323, ISSN 0026-2714, DOI: 10.1016/j.microrel.2010.01.006, 2010.

Parameter Selection for Health Monitoring of Electronic Products, Sachin Kumar, Michael Pecht, Microelectronics Reliability, Volume 50, Issue 2, February 2010, Pages 161-168, ISSN 0026-2714, DOI: 10.1016/j.microrel.2009.09.016, 2010.

2009

Application of Blind Source Separation Techniques for Generation of PHM Useful Information, Bruno P. Leão, João P. P. Gomes, Roberto K. H. Galvão, and Takashi Yoneyama, Annual Conference of the Prognostics and Health Management Society, 2009

Benchmarking Diagnostic Algorithms on an Electrical Power System Testbed,Tolga Kurtoglu, Sriram Narasimhan, Scott Poll, David Garcia, Stephanie Wright, 2009

Analysis of Built-In Self-Tests for Electronic Control Units, K. Wojtek Przytula, David Allen, Tsai-Ching Lu, Noel Anderson, and Jason Wanner, Annual Conference of the Prognostics and Health Management Society, 2009

Effects of Lightning Injection on Power-MOSFETs, Jose Celaya, Sankalita Saha, Phil Wysocki, Jay Ely, Truong Nguyen, George Szatkowski, Sandra Koppen, John Mielnik, Roger Vaughan and Kai Goebel, Annual Conference of the Prognostics and Health Management Society, 2009

Experimental Data Collection and Modeling for Nominal and Fault Conditions on Electro-Mechanical Actuators, Edward Balaban, Abhinav Saxena, Kai Goebel, Carl S. Byington, Matthew Watson, Sudarshan Bharadwaj, and Matthew Smith, Annual Conference of the Prognostics and Health Management Society, 2009

Methods for Probabilistic Fault Diagnosis: An Electrical Power System Case Study, Brian W. Ricks, Ole J. Mengshoel, Annual Conference of the Prognostics and Health Management Society, 2009

Modeling Li-ion Battery Capacity Depletion in a Particle Filtering Framework, Bhaskar Saha and Kai Goebel, Annual Conference of the Prognostics and Health Management Society, 2009

Power Management for a DistributedWireless Health Management Architecture, Sankalita Saha, Bhaskar Saha, and Kai Goebel, Annual Conference of the Prognostics and Health Management Society, 2009

Prognostics Enhanced Reconfigurable Control of Electro-Mechanical Actuators, DouglasW. Brown, George Georgoulas, Brian Bole, Hai-Long Pei, Marcos Orchard, Liang Tang, Bhaskar Saha, Abhinav Saxena, Kai Goebel, and George Vachtsevanos, Annual Conference of the Prognostics and Health Management Society, 2009

Robust Differential Protection with Intermittent Cable Faults for Aircraft AC Generators, Ashraf Tantawy, Xenofon Koutsoukos, and Gautam Biswas, Annual Conference of the Prognostics and Health Management Society, 2009

A prognosis case study for electrolytic capacitor degradation in DC-DC converters, Chetan S. Kulkarni, Gautam Biswas, and Xenofon Koutsoukos, Annual Conference of the Prognostics and Health Management Society, 2009

An Innovative Approach to Electromechanical Actuator Emulation and Damage Propagation Analysis, Neil Kunst and Chris Lynn, Annual Conference of the Prognostics and Health Management Society, 2009

Effect of Electrostatic Discharge on Electrical Characteristics of Discrete Electronic Components (Technical Brief), Phil Wysocki, Vladislav Vashchenko, Jose Celaya, Sankalita Saha, and Kai Goebel, Annual Conference of the Prognostics and Health Management Society, 2009

Overview of PHMBIT, Bruce Woollard, Annual Conference of the Prognostics and Health Management Society(Technical Brief), 2009

Towards Accelerated Aging Methodologies and Health Management of Power MOSFETs (Technical Brief), Jose R. Celaya, Nishad Patil, Sankalita Saha, Phil Wysocki and Kai Goebel, Annual Conference of the Prognostics and Health Management Society(Technical Brief), 2009

A Prognostic Model for Electrohydraulic Servovalves, Lorenzo Borello, Matteo Dalla Vedova, Giovanni Jacazio, and Massimo Sorli, Annual Conference of the Prognostics and Health Management Society, 2009

Design of an Electrical Power System using a Functional Failure and Flow State Logic Reasoning Methodology, David C. Jensen, Irem Y. Tumer, and Tolga Kurtoglu, Annual Conference of the Prognostics and Health Management Society, 2009

Physics-of-failure-based prognostics for electronic products, M. Pecht, J. Gu, 2009.

Use of the Skin Effect for Detection of Interconnect Degradation, M. H. Azarian, D. Kwon, and M. Pecht, IMAPS 42nd Int. Symposium on Microelectronics, San Jose, CA, Nov. 1-5, 2009.

Identification of Interconnect Failure Mechanisms Using RF Impedance Analysis, D. Kwon, M. H. Azarian, and M. Pecht, Thirteenth IEEE Workshop on Signal Propagation on Interconnects, Strasbourg, France, May 12-15, 2009.

A Methodology for Determining the Return on Investment Associated with Prognostics and Health Management, K. Feldman, T. Jazouli, and P. Sandborn, IEEE Trans. on Reliability, Strasbourg, Vol. 58, No. 2, pp. 305-316, June 2009.

Baseline Performance of Notebook Computers Under Various Environmental and Usage Conditions for Prognostics, Sachin Kumar, Michael Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 3, September 2009.

Model-based and Data-driven Prognosis of Automotive and Electronic Systems, Chaitanya Sankavaram, Bharath Pattipati, Anuradha Kodali, Krishna Pattipati, Mohammad Azam, Sachin Kumar, and Michael Pecht, 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, August 22-25, 2009.

A Fusion Prognostics Method for Remaining Useful Life Prediction of Electronic Products, Shunfeng Cheng, and Michael Pecht, 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, August 22-25, 2009.

A Framework of Cost-effective and Accurate Maintenance Combining CBM RCM and Data Fusion, Gang Niu, Michael Pecht, Proceedings of ICRMS 2009, July 21-25, 2009.

Health Assessment and Prognostics of Electronic Products-An Alternative Method of product Life Cycle Cost Improvement, Jie Gu, Daniel lau, Michael Pecht, Proceeding of ICRMS 2009, July 21-25, 2009.

Physics-of-failure based Prognostics for Electronic Products, Michael Pecht and Jie Gu, Transactions of the Institute of Measurement and Control 31, 3/4 (2009), pp. 309-322.

Precursor Parameter Identification for Power Supply Prognostics and Health Management, Huiguo Zhang, Rui Kang, Michel Pecht, Proceedings of ICRMS 2009, July 20-24, 2009.

Detection of Solder Joint Failure Precursors on Tin-Lead and Lead-Free Assemblies using RF Impedance Analysis, Daeil Kwon, Michael H. Azarian, and Michael Pecht, Electronic Components and Technology Conference, 2009.

Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance, Daeil Kwon, Michael H. Azarian, and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 9, No. 2, June 2009.

Prognostics Implementation in Aerospace Applications, Dr Michael Pecht, Director CALCE, Maryland University, Prognostics & Health Management, Condition-Based Maintenance and Health & Usage Monitoring Symposium, 21st - 22nd April, 2009.

Prognostics-Based Product Qualification, Pecht, M. and Gu, J., IEEE Aerospace Conference, Big Sky, MT, March 7-14, 2009.

A Residual Estimation Based Approach for Isolating Faulty Parameters, Kumar, S., Dolev, E., Pompetzki, M., and Pecht, M., IEEE Aerospace Conference, Big Sky, MT, March 7-14, 2009

Detecting Failure Precursors in BGA Solder Joints, R. Jaai, M. Pecht, J. Cook, 55th annual Reliability and Maintainability Symposium (RAMS), Fort Worth, Texas, Jan 2009.

2008

No-fault-found and intermittent failures in electronic products, Haiyu Qi, Sanka Ganesan, Michael G. Pecht , Microelectronics Reliability , Vol. 48, Pg. 663–674, 2008

The Analysis of Return on Investment for PHM Applied to Electronic Systems, Kiri Feldman, Peter Sandborn, and Taoufik Jazouli, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008

Failure Precursors for Insulated Gate Bipolar Transistors, Nishad Patil, Diganta Das, Kai Goebel, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

IDDQ Trending as a Precursor to Semiconductor Failure , Guangfan Zhang, Diganta Das, Roger Xu, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Failure Mechanism Based Prognostics, Sony Mathew, Diganta Das, Roger Rosenberger, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Assessing the Operating Environment of IC Sockets in High-End Servers for Prognostics and Health Monitoring, Leoncio Lopez and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Early Detection of Interconnect Degradation Using RF Impedance and SPRT, Daeil Kwon, Michael H Azarian, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Failure Prognostics of Multilayer Ceramic Capacitor in Temperature-Humidity- Bias Conditions, Jie Gu, Michael Azarian, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Maxima-SPRT Methodology for Health Monitoring of Contact Resistance in IC Sockets, Leoncio Lopez and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9, 2008.

Anomaly Detection in Electronic Products, Abraham Tomy Michael, Sachin Kumar, Sony Mathew and Michael Pecht, 2nd Electronics System-Integration Technology Conference, Greenwich, London, UK, September 1-4, 2008.

Sensor System Selection for Prognostics and Health Monitoring, S. Cheng, M. Azarian, and M. Pecht, 2008 ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference (IDETC/CIE 2008), Brooklyn, New York, USA, August 3-6, 2008.

Analyzing the Return on Investment Associated With Prognostics and Health Management of Electronic Products, Kiri Feldman and Peter Sandborn, 2008 ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference
(I
DETC/CIE 2008), Brooklyn, New York, USA,
August 3-6, 2008.

Failure Precursors for Insulated Gate Bipolar Transistors, N. Patil, D. Das, K. Goebel and M. Pecht, 9th International Seminar on Power Semiconductors, Prague, 27-29 August 2008.

Health Assessment of Electronic Products using Mahalanobis Distance and Projection Pursuit Analysis, Sachin Kumar, Vasilis Sotiris, and Michael Pecht, International Journal of Computer, Information, and Systems Science, and Engineering, vol.2 Issue.4 , pp.242-250, 2008.

Qualification for product development, Weiqiang Wang; Azarian, Michael H.; Pecht, Michael, International Conference on Electronic Packaging Technology and the International Symposium on High Density Packaging (ICEPT-HDP), 28-31 July 2008.

A Hybrid Prognostics Methodology for Electronics Systems, S. Kumar, M. Torres, M.Pecht, and Y. C. Chan - Special Session on Computational Intelligence for Anomaly Detection, Diagnosis, and Prognosis, IEEE World Congress on Computational Intelligence (WCCI 2008), June 1-6, 2008, Hong Kong.

Data Analysis Approach for System Reliability, Diagnostics and Prognostics,S. Kumar and M. Pecht - Pan Pacific Microelectronics Symposium, 22 - 24 Jan, 2008, Hawaii.

Effect of Solder Joint Degradation on RF Impedance, Kwon, D., Azarian, M., and Pecht, M., 12th IEEE Workshop on Signal Propagation on Interconnect, pp. 1-4 Avignon, France, 12-15 May 2008.

Detection of Solder Joint Degradation Using RF Impedance Analysis, Kwon, D., Azarian, M., and Pecht, M., IEEE Electronic Components and Technology Conference, pp. 606-610, Lake Buena Vista, FL, 27-30 May 2008.

Prognostics of Electronics under Vibration Using Acceleration Sensors, Jie Gu, Donald Barker, and Michael Pecht, Proceeding for 62nd Meeting of the Society for Machinery Failure Prevention Technology (MFPT), pp. 253-263, Virginia Beach, VA, May 2008.

Autonomous Prognostic Monitoring Device, S.Cheng, M. Torres, L. Thomas, and M. Pecht, Proceedings of the 62th Meeting of the Society for Machinery Failure Prevention Technology, pp.505-516 , Virginia Beach, VA, May 2008.

Mahalanobis Distance and Projection Pursuit Analysis for Health Assessment of Electronic Systems, S. Kumar, V. Sotiris, and M. Pecht, IEEE Aerospace Conferece, Big Sky, Montana, March 2008.

Prognostics and Health Management Using Physics of Failure, J. Gu and M. Pecht, 54th annual Reliability and Maintainability Symposium (RAMS), Las Vegas, Nevada, Jan. 2008

2007

Guest Editorial: Introduction to Special Section on Electronic Systems Prognostics and Health Management, P. Sandborn and M. Pecht, Microelectronics Reliability, ,Vol. 47, No. 12, pp. 1847-1848, December 2007.

A Maintenance Planning and Business Case Development Model for the Application of Prognostics and Health Management (PHM) to Electronic Systems,P. A. Sandborn and C. Wilkinson, Microelectronics Reliability, , Vol. 47, No. 12, pp. 1889-1901, December 2007.

Life Cycle Cost Estimation of Using Prognostic Health Management (PHM) for Helicopter Avionics, E. Scanff, K.L. Feldman, S. Ghelam, P. Sandborn, M. Glade, and B. Foucher, Microelectronics Reliability, , Vol. 47, No. 12, pp. 1857-1864, December 2007.

Integrating Technology Obsolescence Considerations into Product Design Planning, K. Feldman and P. Sandborn, Proceedings of the ASME 2007 International Design Engineering Conferences & Computers and Information in Engineering Conference, ,Las Vegas, NV, Sept. 2007.

Prognostics Implementation of Electronics under Vibration Loading, J. Gu, D. Barker and M. Pecht, Microelectronics Reliability, Vol. 47, Issue 12, pp. 1849-1856, Dec. 2007.

Multivariate State Estimation Technique for Remaining Useful Life Prediction of Electronic Products, S. Cheng and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 26-32, Arlington, VA, Nov, 2007.

Health Monitoring of Electronic Products Using Symbolic Time Series Analysis, S. Kumar and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 73-80, Arlington, VA, Nov, 2007.

Support Vector Prognostics Analysis of Electronic Products and Systems, V. Sotiris and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 120-127, Arlington, VA, Nov, 2007.

Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration, J. Gu, D. Barker, and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp.50-57, Nov. 2007.

Embedded Remaining Life Prognostics and Diagnostics of Electronics, V. Rouet, A. Delye, N. Vichare, M. Pecht, and B. Foucher, MicroNanoReliability Congress, Berlin, Germany, September 2-5, 2007

Technology Assessment of Sensor Systems for Prognostics and Health Monitoring, B. Tuchband, S. Cheng, and M. Pecht, IMAPS on Military, Aerospace, Space and Homeland Security: Packaging Issues and Applications (MASH), May, 2007.

Advanced Electronic Prognostics Through System Telemetry and Pattern Recognition Methods, Leon Lopez, Microelectronics Reliability Vol. 47, pp. 1865–1873, May 2007.

Virtual Remaining Life Assessment of Electronic Hardware Subjected to Shock and Random Vibration Life Cycle Loads, S. Mathew, D. Das, M. Osterman, M. Pecht, R. Ferebee, and J. Clayton,  Journal of the IEST, Vol. 50, No. 1, pp. 86- 97, April 2007 .

Prognostics of Ceramic Capacitor Temperature-Humidity-Bias Reliability Using Mahalanobis Distance Analysis, L. Nie, M. Azarian, M. Keimasi, and M. Pecht, Circuit World, Vol. 33, No.3, pp. 21-28, 2007.

The Use of Prognostics in Military Electronic Systems, B. Tuchband and M. Pecht, Proceedings of the 32nd GOMACTech Conference, pp. 157-160, Lake Buena Vista, FL, March 19-22, 2007.

Energetic Material/Systems Prognostics, D. Han, M. Pecht, D. Anand, and R. Kavetsky, 53rd Annual Reliability & Maintainability Symposium (RAMS), Florida, 2007.

Prognostics Implementation Methods for Electronics, J. Gu, N. Vichare, T. Tracy, and M. Pecht, 53rd Annual Reliability & Maintainability Symposium (RAMS), Florida, 2007.

An Enhanced Prognostic Model for Intermittent Failures in Digital Electronics, G. Zhang, C. Kwan, R. Xu, N. Vichare, and M. Pecht, IEEE Aerospace Conference, Big Sky, MT, March 2007.

Environment and Usage Monitoring of Electronic Products for Health Assessment and Product Design, N. Vichare, P. Rodger, V. Eveloy, and M. Pecht, International Journal of Quality Technology and Quantitative Management, 2007.

2006

Ensemble Based Systems in Decision Making, Rob Polikar, IEEE Circuits and Systems Magazine, Third Quarter, 2006.

Prognostic Assessment of Aluminum Support Structure on a Printed Circuit Board, S. Mathew, D. Das, M. Osterman, M. Pecht, and R. Ferebee ASME Journal of Electronic Packaging, Vol. 128, Issue 4, pp. 339-345, December 2006.

A Methodology for Assessing the Remaining Life of Electronic Products, S. Mathew, P. Rodgers, V. Eveloy, N. Vichare, and M. Pecht, International Journal of Performability Engineering, Vol. 2, No. 4, pp. 383-395, October, 2006.

Enabling Electronic Prognostics Using Thermal Data, N. Vichare and M. Pecht, Proceedings of the 12th International Workshop on Thermal Investigation of ICs and Systems, Nice, Côte d'Azur, France, 27-29 September 2006.

Methods for Binning and Density Estimation of Load Parameters for Prognostics and Health Management, Vichare N., Rodgers P., and Pecht, M., International Journal of Performability Engineering, Vol. 2, No. 2, April 2006.

Prognostics and Health Management of Electronics, N. Vichare and M. Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 1, March 2006.

2005

A Decision Support Model for Determining the Applicability of Prognostic Health Management (PHM) Approaches to Electronic Systems, P. Sandborn, Proc. Reliability and Maintainability Symposium, pp. 422-427, January 24-27, 2005.

2004

In Situ Temperature Measurement of a Notebook Computer - A Case Study in Health and Usage Monitoring of Electronics, N. Vichare, P. Rodgers, V. Eveloy, and M. Pecht IEEE Transactions on Device and Materials Reliability, Vol. 4., No. 4, pp. 658-663, December 2004.

Prognostics and Health Management for Improved Dispatchability of Integrated Modular Avionics Equipped Aircraft, C. Wilkinson,23rd Digital Avionics Systems Conference (DASC), Salt Lake City, UT, October 2004.

Application of Health Monitoring to Product Take-back Decisions, N. Vichare, P. Rodgers, M. Azarian, and M. Pecht, Proceedings of the Joint International Congress and Exhibition - Electronics Goes Green 2004, pp. 945-951, Berlin, Germany, September 6-8 2004.

Prognostics and Health Management for Avionics, Wilkinson, C., Humphrey, D., Vermeire, B., and Houston, J., IEEE Aerospace Conference, Big Sky, MT, Mar. 2004.

Life Consumption Monitoring for Electronics Prognostics, S. Mishra, S. Ganesan, M. Pecht and J. Xie, Proceedings of the IEEE Aerospace Conference, Vol. 5, pp. 3455 - 3467. March 6-13, 2004.

Application of In-Situ Health Monitoring and Prognostic Sensors, J. Xie and M. Pecht 9th Pan Pacific Microelectronics Symposium Exhibits and Conference, Kahuku, Oahu, Hawaii, 10-12 February 2004.

Load Characterization during Transportation, A. Ramakrishnan and M. Pecht, Microelectronics Reliability, Vol. 44, No. 2, pp. 333-338, January 2004.

2003

Reliability Prediction Modeling of Semiconductor Light Emitting Device, J. Xie and M. Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 3, No. 4, pp. 218-222, December 2003.

Methods for Predicting the Remaining Life of Electronic Assemblies with Carbon Nanotubes and an Optical Transduction Technique, P. Casey, S. Ganesan, M. Pecht and D. Anand, Proceeding of IMECE' 03 - 2003 ASME International Mechanical Engineering Congress, Washington, D.C. November 15-21, 2003.

A Life Consumption Monitoring Methodology for Electronic Systems, Ramakrishnan, A. and Pecht, M., IEEE Transactions on Components and Packaging Technologies, Vol. 26, No. 3, pp. 625-634, September 2003.

Remaining Life Assessment of Aging Electronics in Avionic Applications, R. Valentin, M. Osterman, B. Newman, The Annual Reliability and Maintainability Proceedings, , pp. 313-318, Tampa, Florida, January 27-30, 2003.

2002

Virtual Life Assessment of Electronic Hardware Used in the Advanced Amphibious Assault Vehicle (AAAV), R. Valentin, J. Cunningham, M. Osterman, A. Dasgupta, M. Pecht and D. Tsagos, Proceedings of the 2002 Winter Simulation Conference, Vol. 1, pp. 948-953, San Diego, California, December 8-11, 2002.

Aging Aircraft Usable Life and Wear-out Issues, D. Humphrey, W. Shawlee, P. Sandborn, D. Lorenson, , Proc. World Aviation Congress (SAE Technical Paper: 2002-1-3013), Phoenix, AZ, November 2002.

Remaining Life Assessment of Shuttle Remote Manipulator System End Effector Electronics Unit, V. Shetty, D. Das, M. Pecht, D. Hiemstra and S. Martin, Proceedings of the 22nd Space Simulation Conference, Ellicott City, MD, October 21-23, 2002.

Remaining Life Prediction of Electronic Products Using Life Consumption Monitoring Approach, S. Mishra, M. Pecht, T. Smith, I. McNee, and R. Harris, Proceedings of the European Microelectronics Packaging and Interconnection Symposium, pp. 136-142, Cracow, June 16-18, 2002.

In-situ Sensors for Product Reliability Monitoring, Mishra, S. and Pecht, M., Proceedings of SPIE, Vol. 4755, pp. 10-19, 2002.

2001

Evaluation of Built-In Test, M. Pecht, M. Dube, M. Natishan, and I. Knowles, IEEE Transactions on Aerospace and Electronic Systems, Vol. 37, No. 1, pp. 266-272, January 2001.

2000 and prior

"Smart" Electronic Systems for Condition-Based Health Management, N. Kelkar, A. Dasgupta, M. Pecht, I. Knowles, M. Hawley, and D. Jennings, Quality and Reliability Engineering International, Vol. 13, pp. 3-7, 1997.

Characterizing the Commercial Avionics Thermal Environment for Field Reliability Assessment, K. Cluff, D. Barker, D. Robbins, and T. Edwards, Proceedings-Institute of Environmental Sciences, pp. 50-57, 1996.

Fuzzy regression analysis for fatigue crack growth, Xin Wu, Jun Ming Hu, and Michael Pecht , Proceedings on Uncertainty Modeling and Analysis, 1990, First International Symposium on, Vol., No., pp 437-440, December 3-5, 1990, doi:10.1109/ISUMA.1990.151292.